Dr. Mohamad Abo Ras

Background

Dr. Mohamad ABO RAS studied at University of Applied Sciences (TFH) in Berlin, Germany. He received his Diploma and master’s degrees in applied Physic / Medical Engineering in 2007 and 2008. During and after his studies he worked in the thermal electrical testing lab at Fraunhofer IZM in the field of thermal characterization of material and components as well as failure analysis. Since 2008 he is working for the Berliner Nanotest and Design GmbH. Main focuses of his research work are development and appliance of test equipment for material characterization, non-destructive methods for failure analysis. For this work he received his Ph.D. from the TU Chemnitz in 2020. From 2010 to 2016 he took on the position of the Chief Technical Officer (CTO). Since 2017 he is the Chief Executive Officer (CEO) of Berliner Nanotest and Design GmbH. Dr. Abo Ras is an author or co-author of over 90 publications in international conferences.

Selected Publications

• Pareek, K. A., May, D., Abo Ras, M., & Wunderle, B. (2021, April). Towards data driven failure analysis using infrared thermography. In 2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (pp. 1-12). IEEE.
• Wargulski, D. R., May, D., Boschman, E., Hutzler, A., Wunderle, B., & Abo Ras, M. (2020, September). Inline failure analysis of electronic components by infrared thermography without high-emissivity spray coatings. In 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC) (pp. 1-5). IEEE.
• Panahandeh, S., May, D., Wargulski, D. R., Boschman, E., Schacht, R., Abo Ras, M. & Wunderle, B. (2021, April). Infrared thermal imaging as inline quality assessment tool. In 2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (pp. 1-6). IEEE.
• Wargulski, D. R., May, D., Grosse-Kockert, C., Boschman, E., Abo Ras, M., & Wunderle, B. (2020, September). Inspection of silver-sinter die attaches by pulsed and lock-in infrared thermography with flash lamp and laser excitation. In 15th Quantitative InfraRed Thermography Conference (pp. 21-30).
• Wargulski, D. R., May, D., Löffler, F., Nowak, T., Petrick, J., Grosse, C., … & Abo Ras, M. (2019, September). An In-line Failure Analysis System Based on IR Thermography Ready for Production Line Integration. In 2019 25th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)(pp. 1-4). IEEE.
• Pareek, K. A., May, D., Meszmer, P., Abo Ras, M., & Wunderle, B. (2022, April). Finite Element Supported Data Augmentation for a Deep Learning Driven Intelligent Failure Analysis System Based on Infrared Thermography. In 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (pp. 1-8). IEEE.
• Panahandeh, S., May, D., Grosse-Kockert, C., Stelzer, A., Rabay, B., Busse, D., … & Abo Ras, M. (2022, April). Inline failure analysis of sintered layers in power modules using infrared thermography. In 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)(pp. 1-7). IEEE.